TY  - RPRT
TI  - Influence of charged walls and defects on DC resistivity and dielectric relaxation in Cu-Cl boracite
AU  - C. Cochard
AU  - T. Granzow
AU  - C. M. Fernandez-Posada
AU  - M. A. Carpenter
AU  - R. G. P. McQuaid
AU  - J. M. Guy
AU  - R. W. Whatmore
AU  - J. M. Gregg
PY  - 2021
DO  - 10.1063/5.0067846
UR  - https://arxiv.org/abs/2108.08582
ID  - 2108.08582
ER  -