@misc{indiciaee4365e2eb903,
  title = {Multi defect detection and analysis of electron microscopy images with deep learning},
  author = {Mingren Shen and Guanzhao Li and Dongxia Wu and Yuhan Liu and Jacob Greaves and Wei Hao and Nathaniel J. Krakauer and Leah Krudy and Jacob Perez and Varun Sreenivasan and Bryan Sanchez and Oigimer Torres and Wei Li and Kevin Field and Dane Morgan},
  year = {2021},
  doi = {10.1016/j.commatsci.2021.110576},
  url = {https://arxiv.org/abs/2108.08883},
  note = {Source identifier: 2108.08883}
}