TY  - RPRT
TI  - Understanding grain boundary electrical resistivity in Cu: the effect of boundary structure
AU  - Hanna Bishara
AU  - Subin Lee
AU  - Tobias Brink
AU  - Matteo Ghidelli
AU  - Gerhard Dehm
PY  - 2021
DO  - 10.1021/acsnano.1c06367
UR  - https://arxiv.org/abs/2108.09148
ID  - 2108.09148
ER  -