@misc{indiciaee4043ac2dce5,
  title = {Resistivity size effect due to surface steps on ruthenium thin films computed with a realistic tight-binding model},
  author = {W. E. Richardson and E. R. Mucciolo and P. K. Schelling},
  year = {2021},
  doi = {10.1063/5.0069046},
  url = {https://arxiv.org/abs/2108.09424},
  note = {Source identifier: 2108.09424}
}