TY  - RPRT
TI  - Resistivity size effect due to surface steps on ruthenium thin films computed with a realistic tight-binding model
AU  - W. E. Richardson
AU  - E. R. Mucciolo
AU  - P. K. Schelling
PY  - 2021
DO  - 10.1063/5.0069046
UR  - https://arxiv.org/abs/2108.09424
ID  - 2108.09424
ER  -