TY  - RPRT
TI  - Temperature-dependent criticality in random 2D Ising models
AU  - Matteo Metra
AU  - Luc Zorrilla
AU  - Maurizio Zani
AU  - Ezio Puppin
AU  - Paolo Biscari
PY  - 2021
DO  - 10.1140/epjp/s13360-021-01939-2
UR  - https://arxiv.org/abs/2108.13725
ID  - 2108.13725
ER  -