TY  - RPRT
TI  - Ferroelectric-HfO2/Oxide Interfaces, Oxygen Distribution Effect and Implications for Device Performance
AU  - Shihui Zhao
AU  - Bowen Li
AU  - Yuzheng Guo
AU  - Huanglong Li
PY  - 2021
DO  - 10.1063/5.0074332
UR  - https://arxiv.org/abs/2109.06698
ID  - 2109.06698
ER  -