TY  - RPRT
TI  - Gate-versus defect-induced voltage drop and negative differential resistance in vertical graphene heterostructures
AU  - Tae Hyung Kim
AU  - Juho Lee
AU  - Ryong-Gyu Lee
AU  - Yong-Hoon Kim
PY  - 2021
DO  - 10.1038/s41524-022-00731-9
UR  - https://arxiv.org/abs/2109.11302
ID  - 2109.11302
ER  -