TY  - RPRT
TI  - Characterization of two-level system noise for microwave kinetic inductance detector comprising niobium film on silicon substrate
AU  - Yoshinori Sueno
AU  - Shunsuke Honda
AU  - Hiroki Kutsuma
AU  - Satoru Mima
AU  - Chiko Otani
AU  - Shugo Oguri
AU  - Junya Suzuki
AU  - Osamu Tajima
PY  - 2022
DO  - 10.1093/ptep/ptac023
UR  - https://arxiv.org/abs/2110.00127
ID  - 2110.00127
ER  -