TY  - RPRT
TI  - Graph-Based Machine Learning Improves Just-in-Time Defect Prediction
AU  - Jonathan Bryan
AU  - Pablo Moriano
PY  - 2023
DO  - 10.1371/journal.pone.0284077
UR  - https://arxiv.org/abs/2110.05371
ID  - 2110.05371
ER  -