@misc{indiciae8d3578301f87,
  title = {Microstructural analysis of GaN films grown on (1 0 0) MgF\$\_2\$ substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry},
  author = {Tobias Niemeyer and Kevin Meyer and Christoph Flathmann and Tobias Meyer and Daniel M. Schaadt and Michael Seibt},
  year = {2022},
  doi = {10.1016/j.jcrysgro.2022.126972},
  url = {https://arxiv.org/abs/2110.06856},
  note = {Source identifier: 2110.06856}
}