TY  - RPRT
TI  - Microstructural analysis of GaN films grown on (1 0 0) MgF$_2$ substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry
AU  - Tobias Niemeyer
AU  - Kevin Meyer
AU  - Christoph Flathmann
AU  - Tobias Meyer
AU  - Daniel M. Schaadt
AU  - Michael Seibt
PY  - 2022
DO  - 10.1016/j.jcrysgro.2022.126972
UR  - https://arxiv.org/abs/2110.06856
ID  - 2110.06856
ER  -