TY  - RPRT
TI  - Fitting three-dimensional Laguerre tessellations by hierarchical marked point process models
AU  - Filip Seitl
AU  - Jesper Møller
AU  - Viktor Beneš
PY  - 2022
UR  - https://arxiv.org/abs/2110.07485
ID  - 2110.07485
ER  -