TY  - RPRT
TI  - Low-Frequency 1/f Noise Characteristics of Ultra-Thin AlO$_{x}$-Based Resistive Switching Memory Devices with Magneto-Resistive Responses
AU  - Jhen-Yong Hong
AU  - Chun-Yen Chen
AU  - Dah-Chin Ling
AU  - Isidoro Martínez
AU  - César González-Ruano
AU  - Farkhad G. Aliev
PY  - 2021
DO  - 10.3390/electronics10202525
UR  - https://arxiv.org/abs/2110.09331
ID  - 2110.09331
ER  -