TY  - RPRT
TI  - Label-Descriptive Patterns and Their Application to Characterizing Classification Errors
AU  - Michael Hedderich
AU  - Jonas Fischer
AU  - Dietrich Klakow
AU  - Jilles Vreeken
PY  - 2022
UR  - https://arxiv.org/abs/2110.09599
ID  - 2110.09599
ER  -