@misc{indiciaeff7781cbbd3b,
  title = {Accelerated Lifetime Testing and Analysis of Delta-doped Silicon Test Structures},
  author = {Connor Halsey and Jessica Depoy and DeAnna M. Campbell and Daniel R. Ward and Evan M. Anderson and Scott W. Schmucker and Jeffrey A. Ivie and Xujiao Gao and David A. Scrymgeour and Shashank Misra},
  year = {2022},
  doi = {10.1109/tdmr.2022.3152376},
  url = {https://arxiv.org/abs/2110.11580},
  note = {Source identifier: 2110.11580}
}