@misc{indiciaed920a7bd7fd6,
  title = {Measurement-induced criticality in extended and long-range unitary circuits},
  author = {Shraddha Sharma and Xhek Turkeshi and Rosario Fazio and Marcello Dalmonte},
  year = {2022},
  doi = {10.21468/scipostphyscore.5.2.023},
  url = {https://arxiv.org/abs/2110.14403},
  note = {Source identifier: 2110.14403}
}