TY  - RPRT
TI  - Measurement-induced criticality in extended and long-range unitary circuits
AU  - Shraddha Sharma
AU  - Xhek Turkeshi
AU  - Rosario Fazio
AU  - Marcello Dalmonte
PY  - 2022
DO  - 10.21468/scipostphyscore.5.2.023
UR  - https://arxiv.org/abs/2110.14403
ID  - 2110.14403
ER  -