@misc{indiciae0c466a42aa42,
  title = {Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process},
  author = {Michihiro Shintani and Riaz-Ul-Haque Mian and Tomoki Nakamura and Masuo Kajiyama and Makoto Eiki and Michiko Inoue},
  year = {2021},
  url = {https://arxiv.org/abs/2111.01369},
  note = {Source identifier: 2111.01369}
}