TY  - RPRT
TI  - Effect of boron nitride defects and charge inhomogeneity on 1/f noise in encapsulated graphene
AU  - Chandan Kumar
AU  - Anindya Das
PY  - 2021
DO  - 10.1063/5.0071152
UR  - https://arxiv.org/abs/2111.09761
ID  - 2111.09761
ER  -