@misc{indiciae6b0a0e4718a9,
  title = {Exploring leakage in dielectric films via automated experiment in scanning probe microscopy},
  author = {Yongtao Liu and Shelby S. Fields and Takanori Mimura and Kyle P. Kelley and Jon F. Ihlefeld and Sergei V. Kalinin},
  year = {2021},
  doi = {10.1063/5.0079217},
  url = {https://arxiv.org/abs/2111.09918},
  note = {Source identifier: 2111.09918}
}