@misc{indiciae7338c1cc6948,
  title = {Can the electric field in radiation-damaged silicon pad diodes be determined by admittance and current measurements?},
  author = {R. Klanner and J. Schwandt},
  year = {2021},
  doi = {10.1016/j.nima.2022.166360},
  url = {https://arxiv.org/abs/2111.11323},
  note = {Source identifier: 2111.11323}
}