TY  - RPRT
TI  - Can the electric field in radiation-damaged silicon pad diodes be determined by admittance and current measurements?
AU  - R. Klanner
AU  - J. Schwandt
PY  - 2021
DO  - 10.1016/j.nima.2022.166360
UR  - https://arxiv.org/abs/2111.11323
ID  - 2111.11323
ER  -