@misc{indiciae4fc6cc69adab, title = {Self-interaction error induces spurious charge transfer artefacts in core-level simulations of x-ray photoemission and absorption spectroscopy of metal-organic interfaces}, author = {Samuel J. Hall and Benedikt P. Klein and Reinhard J. Maurer}, year = {2021}, url = {https://arxiv.org/abs/2112.00876}, note = {Source identifier: 2112.00876} }