TY  - RPRT
TI  - Self-interaction error induces spurious charge transfer artefacts in core-level simulations of x-ray photoemission and absorption spectroscopy of metal-organic interfaces
AU  - Samuel J. Hall
AU  - Benedikt P. Klein
AU  - Reinhard J. Maurer
PY  - 2021
UR  - https://arxiv.org/abs/2112.00876
ID  - 2112.00876
ER  -