TY  - RPRT
TI  - Critical assessment of machine-learned repulsive potentials for the Density Functional based Tight-Binding method: a case study for pure silicon
AU  - Dylan Bissuel
AU  - Tristan Albaret
AU  - Thomas A. Niehaus
PY  - 2021
DO  - 10.1063/5.0081159
UR  - https://arxiv.org/abs/2112.03707
ID  - 2112.03707
ER  -