@misc{indiciae0b83fd1494c1,
  title = {Understanding Hot Carrier Reliability in FinFET Technology from Trap-based Approach},
  author = {Runsheng Wang and Zixuan Sun and Yue-Yang Liu and Zhuoqing Yu and Zirui Wang and Xiangwei Jiang and Ru Huang},
  year = {2021},
  url = {https://arxiv.org/abs/2112.11753},
  note = {Source identifier: 2112.11753}
}