TY  - RPRT
TI  - Understanding Hot Carrier Reliability in FinFET Technology from Trap-based Approach
AU  - Runsheng Wang
AU  - Zixuan Sun
AU  - Yue-Yang Liu
AU  - Zhuoqing Yu
AU  - Zirui Wang
AU  - Xiangwei Jiang
AU  - Ru Huang
PY  - 2021
UR  - https://arxiv.org/abs/2112.11753
ID  - 2112.11753
ER  -