@misc{indiciaec3358dc9ccf5,
  title = {Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment},
  author = {Subhajit Ghosh and Harshad Surdi and Fariborz Kargar and Franz A. Koeck and Sergey Rumyantsev and Stephen Goodnick and Robert Nemanich and Alexander A. Balandin},
  year = {2021},
  doi = {10.1063/5.0083383},
  url = {https://arxiv.org/abs/2112.14695},
  note = {Source identifier: 2112.14695}
}