TY  - RPRT
TI  - Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment
AU  - Subhajit Ghosh
AU  - Harshad Surdi
AU  - Fariborz Kargar
AU  - Franz A. Koeck
AU  - Sergey Rumyantsev
AU  - Stephen Goodnick
AU  - Robert Nemanich
AU  - Alexander A. Balandin
PY  - 2021
DO  - 10.1063/5.0083383
UR  - https://arxiv.org/abs/2112.14695
ID  - 2112.14695
ER  -