@misc{indiciaefadb6082773c,
  title = {Registration-free localization of defects in 3-D parts from mesh metrology data using functional maps},
  author = {Xueqi Zhao and Enrique del Castillo},
  year = {2021},
  url = {https://arxiv.org/abs/2112.14870},
  note = {Source identifier: 2112.14870}
}