@misc{indiciaeeab25cb5926b,
  title = {Comparing different solutions for testing resistive defects in low-power SRAMs},
  author = {Nunzio Mirabella and Michelangelo Grosso and Giovanna Franchino and Salvatore Rinaudo and Ioannis Deretzis and Antonino La Magna and Matteo Sonza Reorda},
  year = {2021},
  url = {https://arxiv.org/abs/2112.15176},
  note = {Source identifier: 2112.15176}
}