@misc{indiciae0ea4bf6febe2,
  title = {Temperature Effect on Charge-state Transition Levels of Defects in Semiconductors},
  author = {Shuang Qiao and Yu-Ning Wu and Xiaolan Yan and Bartomeu Monserrat and Su-Huai Wei and Bing Huang},
  year = {2022},
  doi = {10.1103/physrevb.105.115201},
  url = {https://arxiv.org/abs/2201.00211},
  note = {Source identifier: 2201.00211}
}