TY  - RPRT
TI  - Temperature Effect on Charge-state Transition Levels of Defects in Semiconductors
AU  - Shuang Qiao
AU  - Yu-Ning Wu
AU  - Xiaolan Yan
AU  - Bartomeu Monserrat
AU  - Su-Huai Wei
AU  - Bing Huang
PY  - 2022
DO  - 10.1103/physrevb.105.115201
UR  - https://arxiv.org/abs/2201.00211
ID  - 2201.00211
ER  -