@misc{indiciae3c173cf89d15,
  title = {OPE of line defects in 5d \$E\_n\$ SCFT},
  author = {Jihwan Oh},
  year = {2022},
  doi = {10.1007/jhep03(2022)178},
  url = {https://arxiv.org/abs/2201.00333},
  note = {Source identifier: 2201.00333}
}