TY  - RPRT
TI  - OPE of line defects in 5d $E_n$ SCFT
AU  - Jihwan Oh
PY  - 2022
DO  - 10.1007/jhep03(2022)178
UR  - https://arxiv.org/abs/2201.00333
ID  - 2201.00333
ER  -