@misc{indiciaef5734f0dff9f,
  title = {Disconnection-Mediated Twin/Twin-Junction Migration in FCC metals},
  author = {Mingjie Xu and Kongtao Chen and Fan Cao and Leonardo Velasco Estrada and Thomas M. Kaufman and Fan Ye and Horst Hahn and Jian Han and David J. Srolovitz and Xiaoqing Pan},
  year = {2022},
  url = {https://arxiv.org/abs/2201.04190},
  note = {Source identifier: 2201.04190}
}