@misc{indiciae4a8d8cefb534,
  title = {Scattering Loss in Precision Metrology due to Mirror Roughness},
  author = {Yehonathan Drori and Johannes Eichholz and Tega Edo and Hiro Yamamoto and Yutaro Enomoto and Gautam Venugopalan and Koji Arai and Rana X Adhikari},
  year = {2022},
  doi = {10.1364/josaa.455127},
  url = {https://arxiv.org/abs/2201.05640},
  note = {Source identifier: 2201.05640}
}