TY  - RPRT
TI  - Designing Topological Defect Lines Protected by Gauge-dependent Symmetry Indicators
AU  - Erda Wen
AU  - Dia'aaldin J. Bisharat
AU  - Robert J. Davis
AU  - Xiaozhen Yang
AU  - Daniel F. Sievenpiper
PY  - 2022
UR  - https://arxiv.org/abs/2201.05907
ID  - 2201.05907
ER  -