@misc{indiciae8c0343aae291,
  title = {A Nanomechanical Testing Framework Yielding Front\&Rear-Sided, High-Resolution, Microstructure-Correlated SEM-DIC Strain Fields},
  author = {Tijmen Vermeij and Jorn Verstijnen and Tim Ramirez y Cantador and Benoit Blaysat and Jan Neggers and Johan Hoefnagels},
  year = {2022},
  doi = {10.1007/s11340-022-00884-0},
  url = {https://arxiv.org/abs/2201.08249},
  note = {Source identifier: 2201.08249}
}