TY  - RPRT
TI  - A Nanomechanical Testing Framework Yielding Front&Rear-Sided, High-Resolution, Microstructure-Correlated SEM-DIC Strain Fields
AU  - Tijmen Vermeij
AU  - Jorn Verstijnen
AU  - Tim Ramirez y Cantador
AU  - Benoit Blaysat
AU  - Jan Neggers
AU  - Johan Hoefnagels
PY  - 2022
DO  - 10.1007/s11340-022-00884-0
UR  - https://arxiv.org/abs/2201.08249
ID  - 2201.08249
ER  -