@misc{indiciae1d97ab2c0fde,
  title = {Simulated Thick, Fully-Depleted CCD Exposures Analyzed with Deep Learning Techniques},
  author = {C. Britt and E. Church and T. Hossbach and B. Loer and R. Saldanha and N. Sinha and K. Woodruff},
  year = {2022},
  url = {https://arxiv.org/abs/2201.08973},
  note = {Source identifier: 2201.08973}
}