TY  - RPRT
TI  - Simulated Thick, Fully-Depleted CCD Exposures Analyzed with Deep Learning Techniques
AU  - C. Britt
AU  - E. Church
AU  - T. Hossbach
AU  - B. Loer
AU  - R. Saldanha
AU  - N. Sinha
AU  - K. Woodruff
PY  - 2022
UR  - https://arxiv.org/abs/2201.08973
ID  - 2201.08973
ER  -