@misc{indiciaef90818483fd5,
  title = {Factors that control stability, variability, and reliability issues of endurance cycle in ReRAM devices: a phase field study},
  author = {Arijit Roy and Min-Gyu Cho and Pil-Ryung Cha},
  year = {2022},
  doi = {10.1063/5.0087758},
  url = {https://arxiv.org/abs/2201.12304},
  note = {Source identifier: 2201.12304}
}