TY  - RPRT
TI  - Factors that control stability, variability, and reliability issues of endurance cycle in ReRAM devices: a phase field study
AU  - Arijit Roy
AU  - Min-Gyu Cho
AU  - Pil-Ryung Cha
PY  - 2022
DO  - 10.1063/5.0087758
UR  - https://arxiv.org/abs/2201.12304
ID  - 2201.12304
ER  -