@misc{indiciaea07dbfc6f304,
  title = {Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes},
  author = {H. Tunç Çiftçi and Michael Verhage and Tamar Cromwijk and Laurent Pham Van and Bert Koopmans and Kees Flipse and Oleg Kurnosikov},
  year = {2022},
  doi = {10.1038/s41378-022-00379-x},
  url = {https://arxiv.org/abs/2202.00952},
  note = {Source identifier: 2202.00952}
}