TY  - RPRT
TI  - Three-temperature modeling of laser-induced damage process in silicon
AU  - Prachi Venkat
AU  - Tomohito Otobe
PY  - 2022
DO  - 10.35848/1882-0786/ac5edb
UR  - https://arxiv.org/abs/2202.01964
ID  - 2202.01964
ER  -