TY  - RPRT
TI  - Devitalizing noise-driven instability of entangling logic in silicon devices with bias controls
AU  - Hoon Ryu
AU  - Ji-Hoon Kang
PY  - 2022
DO  - 10.1038/s41598-022-19404-0
UR  - https://arxiv.org/abs/2202.04281
ID  - 2202.04281
ER  -