TY  - RPRT
TI  - Scalable $\rm Al_2O_3-TiO_2$ Conductive Oxide Interfaces as Defect Reservoirs for Resistive Switching Devices
AU  - Yang Li
AU  - Wei Wang
AU  - Di Zhang
AU  - Maria Baskin
AU  - Aiping Chen
AU  - Shahar Kvatinsky
AU  - Eilam Yalon
AU  - Lior Kornblum
PY  - 2022
DO  - 10.1002/aelm.202200800
UR  - https://arxiv.org/abs/2202.04477
ID  - 2202.04477
ER  -