TY  - RPRT
TI  - Optical and Strain Stabilization of Point Defects in Silicon Carbide
AU  - Jonathan R. Dietz
AU  - Evelyn L. Hu
PY  - 2022
DO  - 10.1063/5.0087805
UR  - https://arxiv.org/abs/2202.04733
ID  - 2202.04733
ER  -